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A curved-crystal spectrometer for soft X-ray emission studies of metals and metallic alloys = Ein gekruemmtes Kristallspektrometer fuer die Untersuchung der Emission weicher Roentgenstrahlen von Metallen und LegierungenZSCHECH, E; BLAU, W; WEHNER, B et al.Crystal research and technology (1979). 1984, Vol 19, Num 7, pp 1007-1014, issn 0232-1300Article

A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithmMATULIS, C. E; TAYLOR, J. C.Journal of applied crystallography. 1993, Vol 26, pp 351-356, issn 0021-8898, 3Article

Resolution investigations of X-ray three-crystal diffractometersBRÜGEMANN, L; BLOCH, R; PRESS, W et al.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 688-692, issn 0108-7673, 5Article

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

A novel Guinier diffractometer with automated adjustment and settingsIHRINGER, J; RÖTTGER, K.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 4A, pp A32-A34, issn 0022-3727Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

Angle calculations for a vertical-axis X-ray diffractometerHSUEH-HSING HUNG.Journal of applied crystallography. 1992, Vol 25, pp 761-765, issn 0021-8898, 6Article

Roentgen-Difraktometer macht Eigenspannungen sichtbar = Residual stresses made visible by X-ray diffractometerAluminium (Düsseldorf). 1984, Vol 60, Num 4, issn 0002-6689, 251Article

A novel monochromator housing with completely shielded beam path from X-ray source to sampleIHRINGER, J; RÖTTGER, K.Journal of applied crystallography. 1994, Vol 27, pp 1063-1065, issn 0021-8898, 6Article

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experimentsWANG, S.-K; DAI, P; TAUB, H et al.Journal of applied crystallography. 1993, Vol 26, pp 697-705, issn 0021-8898, 5Article

A personal-computer-controlled single-crystal diffractometerSVENSSON, C; STAHL, K.Journal of applied crystallography. 1993, Vol 26, pp 728-729, issn 0021-8898, 5Article

Angle calculations for a six-circle surface X-ray diffractometerLOHMEIER, M; VLIEG, E.Journal of applied crystallography. 1993, Vol 26, pp 706-716, issn 0021-8898, 5Article

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Stand und Entwicklungstendenzen der Automatisierung der Roentgenpulverdiffraktometrie = Position and tendencies of development of the automatical powder diffractometryHEROLD, A.Freiberger Forschungshefte. Reihe B. 1984, Vol 243, pp 7-10, issn 0071-9420Article

An automatic four-circle diffractometer designed for precise lattice-parameter determinationKUCHARCZYK, D; PIETRASZKO, A; ŁUKASEWICZ, K et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 467, 3Article

Accuracy in powder diffraction II. International conferencePRINCE, E; STALICK, J. K.NIST special publication. 1992, Num 846, issn 1048-776X, 237 p.Conference Proceedings

Orientation of single crystals in an x-ray diffractometer with a two-dimensional detector and an optical displayRUBINSKII, S. V; KHEILER, D. M.Soviet physics. Crystallography. 1990, Vol 35, Num 5, pp 626-629, issn 0038-5638Article

Schnelle Badanalyse vermindert die Kosten der Aluminiumverhuettung = Fast electrolytic melt analysis reduces the costs of the aluminium smeltingAluminium (Düsseldorf). 1984, Vol 60, Num 9, issn 0002-6689, 650Article

A new powder diffraction method for linear detectorsBENO, M. A; KNAPP, G. S.Review of scientific instruments. 1993, Vol 64, Num 8, pp 2201-2206, issn 0034-6748Article

Characterization of Pousao Pigments and Extenders by Micro-X-ray Diffractometry and Infrared and Raman MicrospectroscopyCORREIA, Andreia M; OLIVEIRA, Maria J. V; CLARK, Robin J. H et al.Analytical chemistry (Washington, DC). 2008, Vol 80, Num 5, pp 1482-1492, issn 0003-2700, 11 p.Article

An open-flow helium cryostat for single-crystal X-ray diffraction experimentsHARDIE, M. J; KIRSCHBAUM, K; MARTIN, A et al.Journal of applied crystallography. 1998, Vol 31, pp 815-817, issn 0021-8898, 5Article